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Ossila Sheet Resistance Lite 1.0.6
Sheet resistance measurement software for the Ossila Four-Point Probe System.
Download (76.4 MB)
Minimum System Requirements
Operating System Windows 10 or 11 (64-bit)
CPU Dual Core 2 GHz
RAM 2 GB
Available Drive Space 262.5 MB
Monitor Resolution 1440 x 900
Connectivity USB 2.0, Ethernet (requires DHCP)
Quick and Accurate Characterization for a Wide Range of Materials
Experience effortless sheet resistance measurements with easy-to-use PC software
Overview | Specifications | Features | Gallery | Software | In the Box | Accessories | Resources and Support
The Ossila Four-Point Probe is an easy-to-use tool for the rapid measurement of sheet resistance, resistivity, and conductivity of materials. Built with a high-specification Ossila Source Measure Unit at its core, the low cost system has a wide measurement range.
Our four-point probe reduces the risk of damaging your delicate samples, such as polymer films with thicknesses on the order of nanometres. The probe head uses rounded, spring-loaded contacts instead of sharp needles for good electrical contact without piercing the sample.
We have curated a compact and durable design for use in busy labs where shelf space is limited. Choose the Ossila Four Point-Probe to elevate your materials characterization and thin film development programs.
Two-Year Warranty
Buy with confidence
Free Software
Keeping your software up to date
Current Range
Characterization of a wide range of materials
Easy to Use
A simple and intuitive interface
Specifications
Voltage Range | ±100 μV to ±10 V |
---|---|
Current Range | ±1 μA to ±200 mA (5 ranges) |
Sheet Resistance Range | 100 mΩ/□ to 10 MΩ/□ (ohms per square) |
Sheet Resistance | Accuracy* | Precision** | Measured at Range |
---|---|---|---|
100 mΩ/□ | ±8% | ±3% | 200 mA |
1 Ω/□ | ±2% | ±0.5% | 200 mA |
10 Ω/□ | ±1% | ±0.5% | 200 mA |
100 Ω/□ | ±1% | ±0.05% | 20 mA |
1 kΩ/□ | ±1% | ±0.03% | 20 mA |
10 kΩ/□ | ±1% | ±0.02% | 2000 µA |
100 kΩ/□ | ±2% | ±0.05% | 200 µA |
1 MΩ/□ | ±8% | ±0.5% | 20 µA |
10 MΩ/□ | ±30% | ±5% | 20 µA |
* Accuracy is the maximum deviation from the true value.
** Precision is the maximum deviation between identical measurements (useful for comparative measurements).
Four-Point Probe Features
Non-Destructive Soft Contact Probes
Designed to measure delicate samples. Rounded, soft contact probes, with a 0.24 mm radius, spread the downward force applied to the sample. The probes are gold plated and mounted on springs for good electrical contact. When making contact, they retract into the head to ensure that a uniform force of 60 grams is applied.
Wide Current Range
Our four-point probe is capable of delivering currents between 1 μA and 200 mA, and can measure voltages from as low as 100 μV up to 10 V. The system can measure sheet resistances in the range of 100 mΩ/□ to 10 MΩ/□, enabling the characterization of a wide range of materials.
High Accuracy
Positive and negative polarity measurements can be performed to calculate the average sheet resistance between positive and negative currents. Teliminating any voltage offsets that may have occurred, hence increasing the accuracy of your measurements.
Linear Translation Stage
With micrometer height control for simple and controlled soft sample contact. The manual knob makes it easy to achieve good electrical contact each time. Plus, the non-slip stage keeps your samples steady and ensures your delicate samples are not damaged by movement during characterization.
Characterize Large Samples
With a large stage area, you can characterize larger samples, up to 6 inch diameter (152.4 mm). Larger samples are less reliant on correction factors and provide more accurate measurements when characterizing your materials.
Four-Point Probe Gallery
Software
Control your four-point probe with our free, user-friendly Ossila Sheet Resistance Lite software. The software can calculate appropriate geometrical correction factors for the sample geometry and the resistivity and conductivity of the sample to allow for extensive, accurate electrical characterization of materials.
Included with the Ossila Four-Point Probe
- Four-point probe with head and stage
- Integrated source measure unit
- 60 x 60 mm glass substrate coated with 400 – 450 nm of FTO
- Power adapter (24 VDC)
- USB-B cable
Accessories and Related Products