Surface Characterization
Surface characterization equipment | Substrates and fabrication | Resources | Technical Support
Accurate and reliable surface characterization is essential across many applications. In coatings, it is important to characterize the properties of new materials (sometimes in both liquid and solid form depending on the application), evalute surface modification, or optimize adhesion and wettability. For electrical characterization of thin films, wafers, and materials, sheet resistance measurements, made simple with a four-point probe system, are critical.
Choose surface characterization equipment from Ossila to equip your lab ready for high performance analysis at an accessible price.
Buy Surface Characterization Equipment
Quickly measure sheet resistance, resistivity, and conductivity of your thin films right on your lab bench, even when you have no access to a PC.
For sheet resistance measurements, simply load in your sample and press go. Inputting the sample dimensions enables the system to also measure conductivity and resistivity while outputting real-time data of current and voltage between the outer pins and the voltage between the inner pins.
As with the Original model, the Four-Point Probe Plus is available with your choice of soft-tipped or sharp-tipped probes to suit your samples.
For efficient ink and coating optimization, choose the Ossila Contact Angle Goniometer. The affordable system equips your lab with intuitive PC software, high quality video, and rapid image capture.
The high-resolution camera captures up to 30 frames per second and the manual focusing lens gives you full control over image sharpness. Using the monochromatic backlight, the software accurately detects the droplet edge. With two modes, the complete software is capable of recording and analysis, both surface tension and contact, for full characterization.
Substrates and Fabrication
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Resources
Buying Guides
What Four-Point Probe Features Do You Need?
Without complex calibration or set up, the Ossila Four Point Probe gives reliable sheet resistance, conductivity, and resistivity values for your thin films.
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What Can You Use a Contact Angle Goniometer For?
Contact angle measurements are a fundamental tool in researching a huge variety of topics. Almost any field of materials science can learn something from a contact angle measurement, so the examples given below are just a few of the many applications that the goniometer can be used for.
Read more...Maintenance and Operation
How to Measure Sheet Resistance using a Four-Point Probe
This guide gives an overview of how to use the Ossila Four-Point Probe, as well as some general tips and tricks for measuring sheet resistance.
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How to Replace the Four-Point Probe Head
Learn how to change the head of your four-point probe with a simple step-by-step video.
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Getting Started with the Ossila Contact Angle Goniometer
Setting up the Ossila Contact Angle Goniometer is a straightforward process that involves a few simple steps. Follow these clear instructions to ensure a smooth and efficient setup for accurate measurements.
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How to Measure Contact Angles with the Goniometer
To measure contact angles with the Goniometer, follow this step-by-step video guide.
Read more...Theory and Applications
Sheet resistance (also known as surface resistance or surface resistivity) is a common electrical property used to characterize thin films of conducting and semiconducting materials.
Learn more...This guide will explain what a contact angle is and how it is measured. It will also show you how the Ossila Contact Angle Goniometer works and how to get the best measurement results.
Read more...Technical Support



